scia Systems, Germany
(Ion Beam Trimmer, Etcher, Sputtering, etc)
Napson Japan
Metrology (Resistivity / Sheet Resistance)
Napson has developed two key technologies for four point probe and non-contact eddy current measurement. Napson supplies the related technologies including semiconductor life time testing, spread resistance measurement, P/N type testing and wafer thickness/flatness testing.
UV Lamps
We represent Japanese company Himeji Rika in Singapore / Malaysia.
HR lamps can be used in KLA-Tencor, NOVA & Nanometrics metrology tools.
HR WEE lamps are used in TEL, DNS & TORAY lithography tracks.