scia Systems, Germany
(Ion Beam Trimmer, Etcher, Sputtering, etc)
Heating Technology from Weiss Technik
Here you will find suitable products for your application!
Get your processes up to running temperature.
Napson Japan
Metrology (Resistivity / Sheet Resistance)
Napson has developed two key technologies for four point probe and non-contact eddy current measurement. Napson supplies the related technologies including semiconductor life time testing, spread resistance measurement, P/N type testing and wafer thickness/flatness testing.
UV Lamps
We represent Japanese company Himeji Rika in Singapore / Malaysia.
HR lamps can be used in KLA-Tencor, NOVA & Nanometrics metrology tools.
HR WEE lamps are used in TEL, DNS & TORAY lithography tracks.